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規格：

     碲化鎘多晶：99.999% CdTe-5N-R-40

  檢測雜質：Cu, Ag, Mg, Ni, Bi,Fe, As, Al, Pb, Zn

     雜質總含量：≤10ppm

     碲化鎘多晶：99.9999% CdTe

 檢測雜質：Cu, In, Ag, Mg, Ni, Bi, Fe, Al, Pb

雜質總含量：≤1ppm

用途：用于光電器件及紅外探測器等。

包裝：滌綸薄膜包裝后，雙層復合膜真空封裝或玻璃管真空封裝。

Specification:

 Poly-crystal Cadmium Telluride:99.999% CdTe-5N-R-40

Testing impurity: Cu, Ag, Mg, Ni,Bi, Fe, As, Al, Pb, Zn

Totalimpurity content: ≤10ppm

Poly-crystalCadmium Telluride: 99.9999% CdTe

Testingimpurity: Cu, In, Ag, Mg, Ni,Bi, Fe, Al, Pb

Totalimpurity content: ≤1ppm

Application: Used for photoelectric device,infrared receiver etc.

Package: Packed with terylene film, anddouble poly-film with vacuum encapsulation. Packed with glass tube with vacuumencapsulation directly.