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橢偏儀是一種利用偏振態的變化 后光束探測樣品反應技術。不像反射儀，橢偏儀參數（PSI和Del）是在非正常的入射角得到。改變入射角。可以得到更多的數據集，這將有助于精煉模型，減少不確定性和提高用戶的數據信心。因此，可變角度橢偏儀比固定角度的橢偏儀系統具有更強大的功能 。目前有兩種方法改變入射角，手動或自動模式。

Ansgtrom Sun公司設計角度調整模型，通過5度間隔后精確預置槽移動手臂手動調節角度和電動精密測角0.01度分辨率兩種模型。此外，測角垂直布局設計，樣品可以水平放置，這是更安全的處理樣品時。可靠的和足夠的原始數據集，更多膜的性能參數，如薄膜或涂層 厚度，光學常數（折射率n，消光系數k指數）、接口、孔隙度甚至成分可以通過建模。在這個意義上，先進的軟件是一個必須為高性能光譜橢偏儀（SE）工具。我們開發了TFprobe 3 x版軟件的系統設置。仿真，測量，分析，數據管理和2D / 3D圖形演示的一體機。 此外，SE200工具覆蓋了很寬的波長范圍內，從深紫外線（DUV）在可見光到近紅外（250～1100nm），標準配置。DUV范圍適合衡量超薄膜，如納米厚度范圍。一個例子是在硅晶片上的原生氧化層，這是典型的2nm厚的**。深紫外光譜橢偏儀也是必不可少的，用戶需要測量多種材料的帶隙。

客戶留言：

“I want to thank Dr. Sun and his team at Angstrom Sun Technologies for all of their help with the purchasing of our Spectroscopic Ellipsometer. Dr. Sun and his team took the time to talk with us about our needs and what would best suit them. After we placed the order we experienced an exceptionally quick shipping timeframe (on site two weeks later). Once we received the well packaged ellipsometer， and with the help of one other person we were able to unbox and set up the ellipsometer. Following their well documented instructions， we had the ellipsometer ready to run. Dr. Sun answered our remaining questions and we were able to start taking measurements on our own. After we had worked with the program more， anytime a question would arise， Dr. Sun and his team’s prompt replies kept us working in the right direction into full functionality. Support included helping with the uploading of our own NK table as well as help with the modeling. Thank you Dr. Sun for taking the time to help us better understand Ellipsometry and for putting out an exceptional product”來自美國科羅拉多的 Benjamin Sheppard

SE系列型號：

Spectroscopic Ellipsometer SE200BA-M300

Spectroscopic Ellipsometer SE200BA-MSP

Spectroscopic Ellipsometer SE200BM-M300

Spectroscopic Ellipsometer SE200BM-M450

Spectroscopic Ellipsometer SE200BM-Solar

Spectroscopic Ellipsometer SE300BM

Spectroscopic Ellipsometer SE500BA